Keywords
FPGA Reliability, SEU Estimation
Abstract
Sponsorship: Department of Energy, Los Alamos National Laboratory. This document describes the methodology used to predict single-event upset rates for Xilinx Virtex FPGAs based on the CREME96 orbit modeling tool. Using this methodology, SEU upset rates are obtained for several Xilinx Virtex FPGAs including Virtex, Virtex-II, and Virtex-4. Further, SEU upset rates are obtained for a variety of orbits for each of these FPGAs.
BYU ScholarsArchive Citation
Engel, Joshua; Morgan, Keith S.; Wirthlin, Michael J.; and Graham, Paul S., "Predicting On-Orbit Static Single Event Upset Rates in Xilinx Virtex FPGAs" (2006). Faculty Publications. 1307.
https://scholarsarchive.byu.edu/facpub/1307
Document Type
Report
Publication Date
2006-11-17
Permanent URL
http://hdl.lib.byu.edu/1877/431
Publisher
Los Alamos National Laboratory
Language
English
College
Ira A. Fulton College of Engineering and Technology
Department
Electrical and Computer Engineering
Copyright Status
© 2006 Los Alamos National Laboratory
Copyright Use Information
http://lib.byu.edu/about/copyright/