Keywords

Aluminum, Dislocations, Electron backscattering diffraction, Grain boundaries

Abstract

The authors wish to thank The Alcoa Technical Research Center for supplying the specimens and performing the compression tests. This work was supported primarily by the MRSEC program of the National Science Foundation under DMR-0079996. Application of electron backscattering diffraction methods to recover estimates of the geometrically necessary dislocation density is described. The limitations of the method arising from the opacity of crystalline materials and the spatial and angular resolution limits are discussed.

Original Publication Citation

Scripta Materialia, Volume 48, Number 2, January 23, pp. 141-145(5)

Document Type

Peer-Reviewed Article

Publication Date

2002-08-01

Permanent URL

http://hdl.lib.byu.edu/1877/104

Publisher

Elsevier Ltd.

Language

English

College

Ira A. Fulton College of Engineering and Technology

Department

Mechanical Engineering

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