Keywords
python, ALS, reflectance, XUV, VUV, fitting
Abstract
This article describes how to use the python refl library in https://bitbucket.org/steve_turley/reflectance-fitting to fit thin film reflectance data from the Advanced Light Source (ALS) at Lawrence Berkeley National Labs. It uses data taken for a thin film of aluminum capped by a thin film of aluminum fluoride on a silicon nitride substrate. The single fit in the example shown here shows the importance of taking into account the oxidation of the aluminum layer as part of the fit.
BYU ScholarsArchive Citation
Turley, R. Steven, "Fitting ALS Reflectance Data Using Python" (2018). Faculty Publications. 2099.
https://scholarsarchive.byu.edu/facpub/2099
Document Type
Report
Publication Date
2018-04-27
Permanent URL
http://hdl.lib.byu.edu/1877/4048
Language
English
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Copyright Use Information
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