Keywords
beryllium coating, electron micrographs, etching, baffle materials
Abstract
Beryllium coatings with varying thicknesses and columnar grain sizes were deposited by low temperature magnetron sputtering and wet chemically etched to enhance diffuse absorption of light. After etching these coatings exhibited a matte black surface finish and low specular reflectance (below 2%) in the IR up to a critical wavelength dependent upon the original grain size of the coating. Extremely thick coatings (350 µm) with original grain sizes of 10 to 12 µm were produced which exhibited specular reflectances below 0.5% up to 50 µm wavelength and a Lambertian BRDF at 10.6 µm averaging 4.3x10-3 ster-1. Scanning electron micrographs are presented for etched and unetched beryllium coatings which showed the etching process produces roughness and porosity over several size scales simultaneously with the maximum size scale limited by the initial coating grain size and thickness. This technique for producing diffuse absorbing baffle materials has great versatility in choice of coating material and substrate and can be expected to provide optical system designers with a variety of material options for stray light management.
Original Publication Citation
C.M. Egert and D.D. Allred, "Light Absorbing Beryllium Coating Produced by Magnetron Sputtering," Stray Light in Optical Systems, Robert P. Breault, Editor, Proceedings of SPIE 1331, 17-178 (199). http://spiedigitallibrary.org/proceedings/resource/2/psisdg/1331/1/17_1?isAuthorized=no http://dx.doi.org/1.1117/12.22676
BYU ScholarsArchive Citation
Allred, David D. and Egert, C. M., "Diffuse Absorbing Beryllium Coatings Produced by Magnetron Sputtering" (1990). Faculty Publications. 1194.
https://scholarsarchive.byu.edu/facpub/1194
Document Type
Peer-Reviewed Article
Publication Date
1990-01-01
Permanent URL
http://hdl.lib.byu.edu/1877/2895
Publisher
Society of Photo Optical Instrumentation Engineers (SPIE)
Language
English
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Copyright Status
© 1990 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Copyright Use Information
http://lib.byu.edu/about/copyright/