Abstract
Radiation effects encountered in space or aviation environments can affect the configuration bits in Field Programmable Gate Arrays (FPGA) causing errors in FPGA output. One method of increasing FPGA reliability in radiation environments includes adding redundant logic to mask errors and allow time for repair. Despite the redundancy added with triple modular redundancy (TMR) and configuration scrubbing there exist some configuration bits that individually affect multiple TMR domains causing errors in FPGA output. A new tool called DeBit is introduced that identifies hardware resources associated with a single bit failure. This tool identifies a novel failure mode involving global routing resources and the failure mode is verified through a series of directed tests on global routing resources. Lastly, a mitigation strategy is proposed and tested on a single error in a triple modular redundancy (TMR) design.
Degree
MS
College and Department
Ira A. Fulton College of Engineering and Technology; Electrical and Computer Engineering
Rights
https://lib.byu.edu/about/copyright/
BYU ScholarsArchive Citation
Swift, James D., "Root Cause Analysis and Classification of Single Point Failures in Designs Applying Triple Modular Redundancy in SRAM FPGAs" (2020). Theses and Dissertations. 8766.
https://scholarsarchive.byu.edu/etd/8766
Date Submitted
2020-12-15
Document Type
Thesis
Handle
http://hdl.lib.byu.edu/1877/etd11488
Keywords
Single Event Upset, Field Programmable Gate Array, Triple Modular Redundancy, Reliability, SEU, FPGA, TMR, James D. Swift, Thesis
Language
english