Abstract
One conventional method for studying dislocations uses the Transmission Electron Microscope (TEM), a complex and expensive piece of equipment which requires extensive specimen preparation in order to thin the specimens to electron transparent thickness. Newer High Resolution Electron Backscatter Diffraction (HREBSD) methods of determining geometrically necessary dislocation content via cross-correlation promise to be able to produce estimates of the dislocation density of the sample over a larger area with considerably less preparation time and using a much more accessible instrument. However, the accuracy of the new EBSD technique needs more experimental verification, including consideration of possible changes in the specimen dislocation density due to the different preparation methods. By comparing EBSD and TEM dislocation measurements of Electron Transparent platinum specimens prepared using the Focused Ion Beam (FIB), along with EBSD dislocations measurements of specimens prepared by both FIB and mechanical polishing techniques, this paper seeks to verify the accuracy of the new method and identify any changes in the specimens’ apparent dislocation density caused by the different preparation processes.
Degree
MS
College and Department
Ira A. Fulton College of Engineering and Technology; Mechanical Engineering
Rights
http://lib.byu.edu/about/copyright/
BYU ScholarsArchive Citation
Friedbaum, Samuel Searle, "Studies of Dislocation Density Quantification Via Cross-Correlation EBSD" (2019). Theses and Dissertations. 8115.
https://scholarsarchive.byu.edu/etd/8115
Date Submitted
2019-08-01
Document Type
Thesis
Handle
http://hdl.lib.byu.edu/1877/etd11067
Keywords
scanning electron microscopy, electron backscatter diffraction, transmission electron microscopy, dislocations, focused ion beam, platinum
Language
English