We use a laser high-harmonics-based extreme-ultraviolet (EUV) polarimeter to determine the optical constants of elemental uranium in the wavelength range from 10 to 47 nm. The constants are extracted from the measure ratio of p-polarized to s-polarized reflectance from a thin uranium film deposited in situ. The film thickness is inferred from a spectroscopic ellipsometry measurement of the sample after complete oxidation in room air. Uranium has been used as a high-reflectance material in the EUV. However, difficulties with oxidation prevented its careful characterization previous to this study. We find that measured optical constants for uranium vary significantly from previous estimates.
Original Publication Citation
Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross, "Characterization of Optical Constants for Uranium from 1 nm to 47 nm," Applied Optics Vol. 49, Iss. 9, pp. 1581-1585 (21).
BYU ScholarsArchive Citation
Brimhall, Nicole; Herrick, Nicholas; Allred, David D.; Turley, R. Steven; Ware, Michael; and Peatross, Justin, "Characterization of Optical Constants for Uranium from 10 to 47 nm" (2010). Faculty Publications. 841.
Optical Society of America
Physical and Mathematical Sciences
Physics and Astronomy
© 2010 Optical Society of America
Copyright Use Information