Abstract

Artificial neural networks (ANNs) are used in many types of computing applications. Traditionally, ANNs have been implemented in software, executing on CPUs and even GPUs, which capitalize on the parallelizable nature of ANNs. More recently, FPGAs have become a target platform for ANN implementations due to their relatively low cost, low power, and flexibility. Some safety-critical applications could benefit from ANNs, but these applications require a certain level of reliability. SRAM-based FPGAs are sensitive to single-event upsets (SEUs), which can lead to faults and errors in execution. However there are techniques that can mask such SEUs and thereby improve the overall design reliability. This thesis evaluates the SEU reliability of neural networks implemented in SRAM-based FPGAs and investigates mitigation techniques against upsets for two case studies. The first was based on the LeNet-5 convolutional neural network and was used to test an implementation with both fault injection and neutron radiation experiments, demonstrating that our fault injection experiments could accurately evaluate SEU reliability of the networks. SEU reliability was improved by selectively applying TMR to the most critical layers of the design, achieving a 35% improvement reliability at an increase in 6.6% resources. The second was an existing neural network called BNN-PYNQ. While the base design was more sensitive to upsets than the CNN previous tested, the TMR technique improved the reliability by approximately 7× in fault injection experiments.

Degree

MS

College and Department

Ira A. Fulton College of Engineering and Technology

Rights

https://lib.byu.edu/about/copyright/

Date Submitted

2020-06-23

Document Type

Thesis

Handle

http://hdl.lib.byu.edu/1877/etd11366

Keywords

artificial neural network, ANN, BNN, CNN, fault injection, FPGA, neural network, neutron radiation, reliability, sensitivity, single event upset, SEU, SRAM-based, TMR, Xilinx

Language

english

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