Abstract

This thesis introduces a new way to characterize the dynamic SEU cross section of an FPGA design in terms of its persistent and non-persistent components. An SEU in the persistent cross section results in a permanent interruption of service until reset. An SEU in the non-persistent cross section causes a temporary interruption of service, but in some cases this interruption may be tolerated. Techniques for measuring these cross sections are introduced. These cross sections can be measured and characterized for an arbitrary FPGA design. Furthermore, circuit components in the non-persistent and persistent cross section can statically be determined. Functional error mitigation techniques can leverage this identification to improve the reliability of some applications at lower costs by focusing mitigation on just the persistent cross section. The reliability of a practical signal processing application in use at Los Alamos National Laboratory was improved by nearly two orders of magnitude at a theoretical savings of over 53% over traditional comprehensive mitigation techniques such as full TMR.

Degree

MS

College and Department

Ira A. Fulton College of Engineering and Technology; Electrical and Computer Engineering

Rights

http://lib.byu.edu/about/copyright/

Date Submitted

2006-07-06

Document Type

Thesis

Handle

http://hdl.lib.byu.edu/1877/etd1377

Keywords

SEU, FPGA, persistence, error propagation, simulator, proton accelerator, radiation, dynamic testing

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