
Electron Microscopy and Micro-analysis
Files
Description
Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Focused Ion Beam micro-machining (FIB), Materials Microanalysis (XEDS, CL, EBSD, EELS, etc)
Publication Date
8-2021
Publisher
Research Networking
City
Provo, UT
Recommended Citation
Rivera, Felipe, "Electron Microscopy and Micro-analysis" (2021). BYU Research Development Office Research Networking Conference. 231.
https://scholarsarchive.byu.edu/researchnetworking/231
