Journal of Undergraduate Research
Keywords
reflectometry, aluminum thin films, vacuum ultraviolet, VUV
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
Vacuum Ultraviolet (VUV) is a range of light on the electromagnetic spectrum corresponding to wavelengths from 40 – 280 nm. VUV photons have too much energy to see visibly and are blocked completely by atmosphere. This wavelength range, however, shows promise for applications in space-based exoplanet research telescopes. Specifically, the chemical fingerprints that this light contains can tell us about the composition and formation of exoplanet atmospheres.
Recommended Citation
Smith, Benjamin and Turley, R. Steven
(2016)
"Reflectometry of Aluminum Thin Films in the Vacuum Ultraviolet,"
Journal of Undergraduate Research: Vol. 2016:
Iss.
1, Article 230.
Available at:
https://scholarsarchive.byu.edu/jur/vol2016/iss1/230