Journal of Undergraduate Research
Keywords
carbon nanotubes, atomic force microscopy probe, silicon dioxide thin-film
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
Atomic force microscopy (AFM) is a useful method for obtaining images of surfaces on the nanometer scale. It has been used to image surfaces in many environments, including in atmosphere, vacuum and fluids. The resolution of these images is subject to the size of the probe tip, which is pyramidal. It has been shown that the attachment of a carbon nanotube to an AFM probe tip increases resolution significantly, in both air and fluids1. The nanotubes have initially been attached by Van der Waals forces, individually, which are too weak for applications in fluids. For use in fluids, glues and coatings have been painstakingly applied to individual nanotube tips. Also, beyond fluids, low-temperature/high-vacuum applications would require a more rigidly attached nanotube than Van der Waals forces can provide.
Recommended Citation
Whittaker, Jed and Davis, Dr. Robert
(2014)
"Attachment of Carbon Nanotubes to Atomic Force Microscopy Probe Tips with a Silicon Dioxide Thin-Film,"
Journal of Undergraduate Research: Vol. 2014:
Iss.
1, Article 1272.
Available at:
https://scholarsarchive.byu.edu/jur/vol2014/iss1/1272