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Journal of Undergraduate Research

Keywords

optical constants, EUV polarimeter, XUV, extreme ultraviolet

College

Physical and Mathematical Sciences

Department

Physics and Astronomy

Abstract

Characterizing mirrors is of great importance when designing optical devices. In order to control the reflectivity, these mirrors are made of multilayer structures. The index of refraction n, which allows for the calculation of the reflectivity, depends on the wavelength of the light. In the XUV (extreme ultraviolet) regime, n is not well known and experiments to determine it have to be done under vacuum due to the absorption of XUV light by air. This complicates the performing of experiments with light of that wavelength.

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