Journal of Undergraduate Research
Keywords
optical constants, EUV polarimeter, XUV, extreme ultraviolet
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
Characterizing mirrors is of great importance when designing optical devices. In order to control the reflectivity, these mirrors are made of multilayer structures. The index of refraction n, which allows for the calculation of the reflectivity, depends on the wavelength of the light. In the XUV (extreme ultraviolet) regime, n is not well known and experiments to determine it have to be done under vacuum due to the absorption of XUV light by air. This complicates the performing of experiments with light of that wavelength.
Recommended Citation
Walter, Fabian and Turley, Dr. R. Steven
(2014)
"Determining Optical Constants with an EUV Polarimeter,"
Journal of Undergraduate Research: Vol. 2014:
Iss.
1, Article 1260.
Available at:
https://scholarsarchive.byu.edu/jur/vol2014/iss1/1260