Journal of Undergraduate Research
Keywords
CVD, chemical vapor deposition, carbon nanotubes, silicon nitride atomic force, microscope probes
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
Atomic Force Microscopy (AFM) is currently one of the most important analytical techniques in nanoscale science and technology. Because it can image surface topography with a resolution better than 10 nm, AFM has allowed the visualization of many nanoscale structures which other microscopic techniques cannot see. Examples include individual DNA strands, extended polymer chains, monolayer steps in crystal surfaces, and carbon nanotube transistors.
Recommended Citation
Housley, Matthew and Davis, Dr. Robert
(2014)
"Direct CVD Growth of Carbon Nanotubes on Silicon Nitride Atomic Force Microscope Probes,"
Journal of Undergraduate Research: Vol. 2014:
Iss.
1, Article 1258.
Available at:
https://scholarsarchive.byu.edu/jur/vol2014/iss1/1258