Journal of Undergraduate Research
Keywords
thin film, carbon nanotube, AFM probes, Atomic Force Microscopy, chemical vapor deposition
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
This report describes the growth of carbon nanotubes on sharp silicon cantilevers through chemical vapor deposition (CVD) and the implementation of thin film and acid etch techniques to shorten the grown nanotubes. Silicon and silicon-nitride probes serve as the principle imaging tools for Atomic Force Microscopy (AFM). Carbon nanotubes may serve to enhance the imaging stability and resolution of AFM through their unique properties. Herein, I describe procedures, explain the presented results, and outline future work on this project.
Recommended Citation
Kitchen, Dale S. and Davis, Dr. Robert C.
(2014)
"A Proposed Thin Film Process for Shortening Carbon Nanotube AFM Probes,"
Journal of Undergraduate Research: Vol. 2014:
Iss.
1, Article 1256.
Available at:
https://scholarsarchive.byu.edu/jur/vol2014/iss1/1256