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Journal of Undergraduate Research

Keywords

x-ray diffraction analysis, piezoelectric material, PZN-PT

College

Physical and Mathematical Sciences

Department

Physics and Astronomy

Abstract

A wide variety of electronic devices, including microphones, acoustic transducers and high-powered microscopes, rely on a phenomenon called piezoelectricity. This is the property by which a crystal, when subjected to an electric field, experiences mechanical strain. Conversely, an applied mechanical stress produces voltage across the crystal. My research has focused on a piezoelectric material called “PZN-PT” (Lead-Zinc-Niobate Lead-Titanate), which exhibits the strongest piezoelectric response of any commercialized piezoelectric material and is currently being used for the development of next-generation electromechanical devices like those mentioned above1. The origin of the impressive properties of PZN-PT has been the topic of extensive scientific inquiry, yet a conclusive explanation has proved to be quite elusive, inviting further investigation. Together with my mentor, I have studied single crystal samples of PZN-PT via x-ray diffraction. We have developed a mathematical and physical model that successfully explains the unique diffuse x-ray scattering features observed in PZN-PT, providing a valuable step along the way to a deeper understanding of PZN-PT and its properties.

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