Journal of Undergraduate Research
Keywords
x-ray spectrometer, lithography, CCD
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
Cell phones, computers, and other electronics seem to get smaller while their speed and efficiency seem to increase—proving that bigger is not better in this realm. One of the main technologies that has been driving these improvements is lithography, the process by which light is used to etch out the component features on the microchips. Improvements in lithography techniques lead to smaller and faster chips. One of the current ideas to improve lithography is to use x-rays, which have a smaller wavelength and will print smaller features. My research is focused on calibrating a spectrometer that will monitor x-ray sources that could be used in applications like lithography.
Recommended Citation
Johnson, Michael and Bergeson, Dr. Scott
(2013)
"Calibration of an X-ray Spectrometer,"
Journal of Undergraduate Research: Vol. 2013:
Iss.
1, Article 2743.
Available at:
https://scholarsarchive.byu.edu/jur/vol2013/iss1/2743