Journal of Undergraduate Research
Keywords
Atomic Force Microscope, AFM, Single-Walled Carbon Nanotubes, SWNT
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
The Atomic Force Microscope (AFM) is a powerful instrument that has many applications in various fields of scientific research. It has the ability to image surfaces without requiring a high vacuum and has the ability to image samples that are in a fluid. It also is able to image surfaces without damaging them, and doesn’t require as much time in sample preparation. It has the resolution capability on the order of tens of nanometers (nm), which is one millionth of a meter. These qualities make the AFM very useful in doing scientific research.
Recommended Citation
Clemens, Michael and Davis, Dr. Robert
(2013)
"The Growth of Single-Walled Carbon Nanotubes on Atomic Force Microscope Tips,"
Journal of Undergraduate Research: Vol. 2013:
Iss.
1, Article 2724.
Available at:
https://scholarsarchive.byu.edu/jur/vol2013/iss1/2724