Journal of Undergraduate Research
Keywords
silicon dioxide, planner graphite, carbon nanotubes, CNT, Atomic Force Microscope, AFM
College
Physical and Mathematical Sciences
Department
Physics and Astronomy
Abstract
BYU’s Nanotube Research Group is currently searching for a method to attach and shorten carbon nanotubes (CNTs) on the tips of Atomic Force Microscope (AFM) probes (image 1). Many have shown that short CNTs grown on the end of AFM probes greatly enhance the resolution and utility of the AFM. With shortened CNTs securely attached to the tip of an AFM probe, the microscope resolution could be improved as much as 5 times. It has been shown that features as small as 1.5nm can be measured . CNTs are strong and have small diameters which make them ideal for scanning probe microscopes .
Recommended Citation
Wilcox, John and Davis, Dr. Robert
(2013)
"Selectivity of Silicon Dioxide on planner Graphite,"
Journal of Undergraduate Research: Vol. 2013:
Iss.
1, Article 2716.
Available at:
https://scholarsarchive.byu.edu/jur/vol2013/iss1/2716