Journal of Undergraduate Research
Keywords
electrical characterization, DNA-templated copper nanowires, electronic devices
College
Physical and Mathematical Sciences
Department
Chemistry and Biochemistry
Abstract
DNA-templated nanofabrication is a promising route toward miniaturization of electronic devices below the 100 nm range. We have developed methods for fabricating micrometer-length copper nanostructures with nanometer heights from DNA templates on silicon surfaces. These structures have been integrated into simple circuits for electrical characterization. Atomic force microscopy and transmission electron microscopy suggest that these constructs are composed of copper metal. However, copper metal was not detected by scanning electron microscopy analysis. The present structures have resistances in the TΩ range or higher, and approaches for achieving improved conductivity are presented.
Recommended Citation
Stoltenberg, Randall and Woolley, Dr. Adam T.
(2013)
"Toward Electrical Characterization of DNA-Templated Copper Nanowires Subtitle (if applicable),"
Journal of Undergraduate Research: Vol. 2013:
Iss.
1, Article 2530.
Available at:
https://scholarsarchive.byu.edu/jur/vol2013/iss1/2530