V-I conversion, CMOS devices, voltage
Sponsorship: AMIS--American Micro-Systems, Inc. This paper investigates the linearity of submicron gate length CMOS devices and their behavior in open loop voltage to current (V-I) converters. Methods are developed to estimate the deviation from linearity in V-I converters due to short-channel effects. Using these methods, a converter is designed and fabricated on a 0.35 micron process. The measured deviation from linearity is less than 1% and the simulated bandwidth is 1 GHz.
BYU ScholarsArchive Citation
Comer, David J.; Comer, Donald; and Shreeve, Aaron, "Linear voltage to current conversion using submicron CMOS devices" (2004). All Faculty Publications. 440.
Ira A. Fulton College of Engineering and Technology
Electrical and Computer Engineering
© 2004 David J. Comer and Donald Comer
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