FPGA Reliability, SEU Estimation
Sponsorship: Department of Energy, Los Alamos National Laboratory. This document describes the methodology used to predict single-event upset rates for Xilinx Virtex FPGAs based on the CREME96 orbit modeling tool. Using this methodology, SEU upset rates are obtained for several Xilinx Virtex FPGAs including Virtex, Virtex-II, and Virtex-4. Further, SEU upset rates are obtained for a variety of orbits for each of these FPGAs.
BYU ScholarsArchive Citation
Engel, Joshua; Morgan, Keith S.; Wirthlin, Michael J.; and Graham, Paul S., "Predicting On-Orbit Static Single Event Upset Rates in Xilinx Virtex FPGAs" (2006). Faculty Publications. 1307.
Los Alamos National Laboratory
Ira A. Fulton College of Engineering and Technology
Electrical and Computer Engineering
© 2006 Los Alamos National Laboratory
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