FPGA Reliability, SEU Estimation
Sponsorship: Department of Energy, Los Alamos National Laboratory. This document describes the methodology used to predict single-event upset rates for Xilinx Virtex FPGAs based on the CREME96 orbit modeling tool. Using this methodology, SEU upset rates are obtained for several Xilinx Virtex FPGAs including Virtex, Virtex-II, and Virtex-4. Further, SEU upset rates are obtained for a variety of orbits for each of these FPGAs.
BYU ScholarsArchive Citation
Engel, Joshua; Morgan, Keith S.; Wirthlin, Michael J.; and Graham, Paul S., "Predicting On-Orbit Static Single Event Upset Rates in Xilinx Virtex FPGAs" (2006). All Faculty Publications. 1307.
Los Alamos National Laboratory
Ira A. Fulton College of Engineering and Technology
Electrical and Computer Engineering
© 2006 Los Alamos National Laboratory
Copyright Use Information