Dynamic SE, Aluminum mirror coating, Oxidation
Data Set Description Summary
The dynamic spectroscopic ellipsometry(SE) data captured on oxidation of ultra thin evaporated aluminum film over starting a few minutes after evaporation and continued for four hours. The Aluminum layer was ca. 15 nm thick. This data needs to be interpreted with J.A. Woollam CompleteEase software. The Aluminum was modeled with Lorentz model and the Alumina was modeled using Cody-Lorentz.
BYU ScholarsArchive Citation
Allred, David D. and Avval, Tahereh G., "The Dynamic Spectroscopic Ellipsometry(SE) Data for Aluminum Thin Films Oxidations" (2020). ScholarsArchive Data. 18.
Data Collection Start Date
Data Collection End Date
NASA award- #NNX15AI24H to Utah Space Grant Consortium
Physical and Mathematical Sciences
Chemistry and Biochemistry
Copyright Use Information
Demonstrating video on Dynamic SE data fitting 1.mp4 (4896 kB)
Demostrating video on dynamic SE data fitting 2.mp4 (39377 kB)
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This work is licensed under a Creative Commons Attribution 4.0 License.