Abstract

We use a laser high-harmonics-based extreme-ultraviolet (EUV) polarimeter to determine the optical constants of elemental uranium in the wavelength range from 10 to 47 nm. The constants are extracted from the measure ratio of p-polarized to s-polarized reflectance from a thin uranium film deposited in situ. The film thickness is inferred from a spectroscopic ellipsometry measurement of the sample after complete oxidation in room air. Uranium has been used as a high-reflectance material in the EUV. However, difficulties with oxidation prevented its careful characterization previous to this study. We find that measured optical constants for uranium vary significantly from previous estimates.

Original Publication Citation

Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross, "Characterization of Optical Constants for Uranium from 1 nm to 47 nm," Applied Optics Vol. 49, Iss. 9, pp. 1581-1585 (21).

Document Type

Peer-Reviewed Article

Publication Date

2010-03-11

Permanent URL

http://hdl.lib.byu.edu/1877/2890

Publisher

Optical Society of America

Language

English

College

Physical and Mathematical Sciences

Department

Physics and Astronomy

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