Keywords

electron backscatter diffraction pattern; EBSD; dynamical electron scattering; cross correlation EBSD; HR-EBSD; simulated electron backscatter diffraction; kinematical EBSD simulation;

Abstract

High-resolution (or \cross-correlation") electron backscatter diffraction analysis (HR-EBSD) utilizes cross-correlation techniques to determine relative orientation and distortion of an experimental electron backscatter diffraction pattern (EBSP) with respect to a reference pattern. The integrity of absolute strain and tetragonality measurements of a standard Si/SiGe material have previously been analyzed using reference patterns produced by kinematical simulation. While the results were promising, the noise levels were significantly higher for kinematically produced patterns, compared to real patterns taken from the Si region of the sample. This paper applies HR-EBSD techniques to analyze lattice distortion in a Si/SiGe sample, using recently developed dynamically simulated patterns. The results are compared with those from experimental and kinematically simulated patterns. Dynamical patterns provide significantly more precision than kinematical patterns. Dynamical patterns also provide better estimates of tetragonality at low levels of distortion relative to the reference pattern; kinematical patterns can perform better at large values of relative tetragonality due to the ability to rapidly generate patterns relating to a distorted lattice. A library of dynamically generated patterns with different lattice parameters might be used to achieve a similar advantage. The convergence of the cross correlation approach is also assessed for the different reference pattern types.

Original Publication Citation

Jackson, Brian E., et al. "Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction." Microscopy and Microanalysis (2016): 1-14.

Document Type

Peer-Reviewed Article

Publication Date

2016-08-10

Permanent URL

http://hdl.lib.byu.edu/1877/3821

Publisher

Microscopy and Microanalysis

Language

English

College

Ira A. Fulton College of Engineering and Technology

Department

Mechanical Engineering

University Standing at Time of Publication

Full Professor

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