Abstract

Modeling of plasticity is often hampered by the difficulty in accurately characterizing dislocationdensity on the microscale for real samples. It is particularly difficult to resolve measureddislocation content onto individual dislocation systems at the length scales most commonly of interestin plasticity studies. Traditionally, dislocation content is analyzed at the continuum levelusing the Nye tensor and the fundamental relation of continuum dislocation theory to interpret informationmeasured by diffraction techniques, typically EBSD or High Resolution EBSD. In thiswork the established Nye-Kroner method for resolving measured geometrically necessary dislocationcontent onto individual slip systems is assessed and extended. Two new methods are alsopresented to relieve the ambiguity of the Nye-Kroner method. One of these methods uses modifiedclassical dislocation equations to bypass the Nye-Kroner relation, and the other estimates the bulkdislocation density via the entry-wise one-norm of the Nye tensor. These methods are validatedvia a novel simulation of distortion fields around continuum fields of dislocation density based onclassical lattice mechanics and then applied to actual HR-EBSD scans of a micro-indented singlecrystals of nickel and tantalum. Finally, a detailed analysis of the effect of the spacing betweenpoints in an EBSD scan (which is related to the step size of the numerical derivatives used in EBSDdislocation microscopy) on geometrically necessary dislocation measurements is conducted.

Degree

PhD

College and Department

Ira A. Fulton College of Engineering and Technology; Mechanical Engineering

Rights

http://lib.byu.edu/about/copyright/

Date Submitted

2015-02-01

Document Type

Dissertation

Handle

http://hdl.lib.byu.edu/1877/etd7539

Keywords

EBSD, dislocation microscopy, cross-correlation, HREBSD

Share

COinS